Multifrequency excitation and detection scheme in apertureless scattering near-field scanning optical microscopy
نویسندگان
چکیده
منابع مشابه
Field enhancement in apertureless near-field scanning optical microscopy.
The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of >15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orde...
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Date The final copy of this thesis has been examined by the signatories, and we find that both the content and the form meet acceptable presentation standards of scholarly work in the above mentioned discipline. Thesis directed by Professor Markus Raschke Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for measuring spectroscopic properties of materials with s...
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Near-field scanning optical microscope (NSOM or SNOM) is a form of scanning probe microscope (SPM), which is used to observe the optical properties of a sample surface with a nanometer-scale spatial resolution. Since the near-field light strongly interacts with the sample surface, or with nanometer-scale objects on the substrate's surface, NSOM is advantageous to excite only the vicinity of a s...
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ژورنال
عنوان ژورنال: Optics Letters
سال: 2017
ISSN: 0146-9592,1539-4794
DOI: 10.1364/ol.42.003157